A Direct Method for Inferring Planar Disorder and Structure from X-ray Diffraction Studies

Dowman P. Varn
Max-Planck-Institut fur Physik Komplexer Systeme
Nothnitzer Strasse 38
01187 Dresden, Germany
Geoffrey S. Canright
Department of Physics and Astronomy
University of Tennessee
Knoxville, Tennessee 37996, USA
and
Telenor Research and Development
1331 Fornebu, Olso, Norway
James P. Crutchfield
Center for Computational Science and Engineering
Physics DepartmenEngineering
University of California, Davis
One Shields Avenue
Davis, CA 95616, USA

ABSTRACT: In a recent publication [D. P. Varn, G. S. Canright, and J. P. Crutchfield, Phys. Rev. B 66:17, 156 (2002)] we introduced a new technique for discovering and describing planar disorder in close-packed structures directly from their diffraction spectra. Here we provide the theoretical development behind those results, adapting computational mechanics to describe one-dimensional structure in materials. We show that the resulting statistical model of the stacking structure---called the epsilon-machine---allows the calculation of measures of memory, structural complexity, and configurational entropy. By way of contrast, we give a detailed analysis of the current alternative approach, the fault model, and offer several criticisms. In the limit of weak faulting, we demonstrate how various architectural features of the epsilon-machine correspond to well-known structural faults in two common types of crystal, 2H and 3C. The methods developed here can be adapted to a wide range of experimental systems in which spectroscopic data is available.


D. P. Varn, G. S. Canright, and J. P. Crutchfield, "A Direct Method for Inferring Planar Disorder and Structure from X-ray Diffraction Studies", Acta Crystallographica Section A (2006) in press. [pdf] = 248 kb.